Values below match the the TEST_MODE__CTRL register do not change. More...
Macros | |
| #define | VL53L1_DEVICETESTMODE_DCR ((VL53L1_DeviceTestMode) 0x04) |
| #define | VL53L1_DEVICETESTMODE_LCR_VCSEL_OFF ((VL53L1_DeviceTestMode) 0x05) |
| #define | VL53L1_DEVICETESTMODE_LCR_VCSEL_ON ((VL53L1_DeviceTestMode) 0x06) |
| #define | VL53L1_DEVICETESTMODE_NONE ((VL53L1_DeviceTestMode) 0x00) |
| #define | VL53L1_DEVICETESTMODE_NVM_COPY ((VL53L1_DeviceTestMode) 0x02) |
| #define | VL53L1_DEVICETESTMODE_NVM_ZERO ((VL53L1_DeviceTestMode) 0x01) |
| #define | VL53L1_DEVICETESTMODE_PATCH ((VL53L1_DeviceTestMode) 0x03) |
| #define | VL53L1_DEVICETESTMODE_REF_SPAD_CHAR_ONLY ((VL53L1_DeviceTestMode) 0x09) |
| #define | VL53L1_DEVICETESTMODE_REF_SPAD_CHAR_WITH_PRE_VHV ((VL53L1_DeviceTestMode) 0x08) |
| #define | VL53L1_DEVICETESTMODE_SPOT_CENTRE_LOCATE ((VL53L1_DeviceTestMode) 0x07) |
Typedefs | |
| typedef uint8_t | VL53L1_DeviceTestMode |
Detailed Description
Values below match the the TEST_MODE__CTRL register do not change.
Macro Definition Documentation
◆ VL53L1_DEVICETESTMODE_DCR
| #define VL53L1_DEVICETESTMODE_DCR ((VL53L1_DeviceTestMode) 0x04) |
DCR - SPAD Self-Check (Pass if Count Rate is less than Threshold)
Definition at line 405 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_LCR_VCSEL_OFF
| #define VL53L1_DEVICETESTMODE_LCR_VCSEL_OFF ((VL53L1_DeviceTestMode) 0x05) |
LCR - SPAD Self-Check (Pass if Count Rate is greater than Threshold and VCSEL off)
Definition at line 408 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_LCR_VCSEL_ON
| #define VL53L1_DEVICETESTMODE_LCR_VCSEL_ON ((VL53L1_DeviceTestMode) 0x06) |
LCR - SPAD Self-Check (Pass if Count Rate is greater than Threshold and VCSEL on)
Definition at line 412 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_NONE
| #define VL53L1_DEVICETESTMODE_NONE ((VL53L1_DeviceTestMode) 0x00) |
Idle
Definition at line 393 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_NVM_COPY
| #define VL53L1_DEVICETESTMODE_NVM_COPY ((VL53L1_DeviceTestMode) 0x02) |
NVM copy
Definition at line 399 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_NVM_ZERO
| #define VL53L1_DEVICETESTMODE_NVM_ZERO ((VL53L1_DeviceTestMode) 0x01) |
NVM zero
Definition at line 396 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_PATCH
| #define VL53L1_DEVICETESTMODE_PATCH ((VL53L1_DeviceTestMode) 0x03) |
Patch
Definition at line 402 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_REF_SPAD_CHAR_ONLY
| #define VL53L1_DEVICETESTMODE_REF_SPAD_CHAR_ONLY ((VL53L1_DeviceTestMode) 0x09) |
Reference SPAD Characterisation Only
Definition at line 422 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_REF_SPAD_CHAR_WITH_PRE_VHV
| #define VL53L1_DEVICETESTMODE_REF_SPAD_CHAR_WITH_PRE_VHV ((VL53L1_DeviceTestMode) 0x08) |
Reference SPAD Characterisation with pre-VHV
Definition at line 419 of file vl53l1_ll_device.h.
◆ VL53L1_DEVICETESTMODE_SPOT_CENTRE_LOCATE
| #define VL53L1_DEVICETESTMODE_SPOT_CENTRE_LOCATE ((VL53L1_DeviceTestMode) 0x07) |
Spot centre locate
Definition at line 416 of file vl53l1_ll_device.h.
Typedef Documentation
◆ VL53L1_DeviceTestMode
| typedef uint8_t VL53L1_DeviceTestMode |
Definition at line 391 of file vl53l1_ll_device.h.