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Classes | |
struct | DummyGenerator< T, NumDims > |
Macros | |
#define | CALL_ASYNC_SUBTEST_COMBINATIONS(PART, NAME, T, NUM_DIMS) |
#define | CALL_SUBTEST_COMBINATIONS(PART, NAME, T, NUM_DIMS) |
#define | CALL_SUBTEST_PART(PART) CALL_SUBTEST_##PART |
#define | EIGEN_USE_THREADS |
#define | TEST_CHIPPING(CHIP_DIM) |
#define | TEST_CHIPPING(CHIP_DIM) |
#define | VECTORIZABLE(VAL) VAL |
Functions | |
template<typename Dst , typename Expr > | |
static void | DefaultAssign (Dst &dst, Expr expr) |
template<bool Vectorizable, TiledEvaluation Tiling, typename Device , typename Dst , typename Expr > | |
static void | DeviceAssign (Device &d, Dst &dst, Expr expr) |
EIGEN_DECLARE_TEST (cxx11_tensor_executor) | |
template<int NumDims> | |
static array< Index, NumDims > | RandomDims (int min_dim=1, int max_dim=20) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_async_execute_binary_expr (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_async_execute_unary_expr (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_binary_expr (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_broadcasting (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_broadcasting_of_forced_eval (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_chipping_lvalue (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_chipping_rvalue (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_generator_op (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_reshape (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_reverse_rvalue (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_shuffle_lvalue (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_shuffle_rvalue (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_slice_lvalue (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_slice_rvalue (Device d) |
template<typename T , int NumDims, typename Device , bool Vectorizable, TiledEvaluation Tiling, int Layout> | |
static void | test_execute_unary_expr (Device d) |
#define CALL_ASYNC_SUBTEST_COMBINATIONS | ( | PART, | |
NAME, | |||
T, | |||
NUM_DIMS | |||
) |
Definition at line 643 of file cxx11_tensor_executor.cpp.
#define CALL_SUBTEST_COMBINATIONS | ( | PART, | |
NAME, | |||
T, | |||
NUM_DIMS | |||
) |
Definition at line 624 of file cxx11_tensor_executor.cpp.
#define CALL_SUBTEST_PART | ( | PART | ) | CALL_SUBTEST_##PART |
Definition at line 621 of file cxx11_tensor_executor.cpp.
#define EIGEN_USE_THREADS |
Definition at line 10 of file cxx11_tensor_executor.cpp.
#define TEST_CHIPPING | ( | CHIP_DIM | ) |
#define TEST_CHIPPING | ( | CHIP_DIM | ) |
#define VECTORIZABLE | ( | VAL | ) | VAL |
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EIGEN_DECLARE_TEST | ( | cxx11_tensor_executor | ) |
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