#include <devices.hpp>

Public Member Functions
	ecl_compile_time_concept_test (InputOutputByteDeviceConcept)
	Implements a concept test for input-output byte devices. More...

Detailed Description

Validates functionality for the input-output byte device concept.

This checks if a device can handle input-output of all char types (char, signed char, unsigned char).

Definition at line 255 of file devices.hpp.

Member Function Documentation

template<typename Implementation >

ecl::InputOutputByteDeviceConcept< Implementation >::ecl_compile_time_concept_test ( InputOutputByteDeviceConcept< Implementation > )

inline

Implements a concept test for input-output byte devices.

The following conditions are required by input-output byte devices:

long read(char &c) : read a single character from the device buffer.
long read(char *s, unsigned long n) : read a char buffer from the device buffer.
long write(char &c) : write a single character to the device buffer.
long write(char *s, unsigned long n) : write a char buffer to the device buffer.
void flush() : a method for flushing the output device buffer to the device.

Along with the read/write functions implemented for signed and unsigned char types.

Definition at line 270 of file devices.hpp.

template<typename Implementation >

Implementation ecl::InputOutputByteDeviceConcept< Implementation >::input_output_byte_device

private

Definition at line 306 of file devices.hpp.

The documentation for this class was generated from the following file: